New TRIXS for measuring low energy surface and interfacial electronic structure at in situ conditions

September 1, 2011

While high energy X-ray methods have been widely used to study the structure and spectroscopy of surfaces and interfaces in extreme environments, light element and valence excitations need lower energy probes that typically require vacuum conditions. Recently, scientists at Argonne developed a new tool—total reflection inelastic X-ray scattering, or TRIXS—to resolve depth-dependent changes in oxygen's electronic structure in a 10 nm-thick La0.6Sr0.4CoO3 thin film grown on SrTiO3. This breakthrough will enable the study of low energy [loss] spectroscopy of surfaces and buried interfaces for a wide range of material systems that require non-vacuum conditions. More »