Argonne National Laboratory

Upcoming Events

Elemental/Chemical TXM Imaging at SSRL

CNM Nanoscience Seminar
Yijin Liu, SLAC
June 25, 2012 11:00AM to 12:00PM
Building 440, Room A105-106
With the use of the 3rd generation synchrotron as X-ray source, the combination of full-field X-ray imaging and X-ray Absorption Spectroscopy (XAS) has be accomplished [1-3]. The capability of performing in situ and ex situ elemental/chemical sensitive microscopy [2, 4] has shown great potential in the applications in various research areas. The development of the methodology will be described and discussed.

In addition, we will present the in situ and ex situ investigation of Li-ion battery electrode materials using Transmission X-ray Microscopy. Morphological change of the active material is observed in real time as the battery is charged/discharged revealing the correlation among structure, chemistry and functionality. Thechemical/elemental sensitive diagnostic of working catalyst solids will also be presented.

[1] Y. Liu, et. al., AIP Conf. Proc. 1365, 357-360 (2011).
[2] F. Meirer, et. al., J. Synchrotron Rad. 18, 773-781 (2011).
[3] Y. Liu, et. al., J. Synchrotron Rad. 19, doi:10.1107/S0909049511049144, (2012).
[4] Y. Liu, et. al., Anal. Bioanal. Chem. doi:10.1007/s00216-012-5818-9, (2012)