How Can Mass Spectrometry Help Materials Science at Argonne?
Recent rapid advances of science and technology of nanostructured materials require new characterization tools with a broad range of analytical capabilities. This is particularly apparent when a combination of high resolution structural and high sensitivity and specificity chemical information has to be obtained directly and without complicated data processing. Mass Spectrometry based analytical tools have a great potential to meet this challenge.
This lecture will focus on development and applications of a mass spectrometer for characterization of solids, which is designed to approach physical limits of sensitivity and resolution (laterally and in depth) and optimized for simultaneous detection of multiple observables. This instrument synergistically combines capabilities of Secondary Ion and Secondary Neutral Mass Spectrometers (SIMS and SNMS) with those of Scanning Electron (SEM) and Optical Microscopes. The presentation will discuss the ongoing work applying this instrument to characterization of solar wind collectors of NASA Genesis spacecraft and to novel nanolayered materials for energy applications, and will highlight its unique capability of conducting in-situ synthesis and characterization experiments on nanostructuring material surfaces.