Upcoming Events

Pushing the Limits of Full Field and Scanning X-ray Microscopy

January 14, 2013 2:00PM to 3:00PM
Presenter 
Hendrik Ohldag, SLAC
Location 
Building 401, Room A1100
Type 
Seminar
Series 
XSD Special Presentation
Abstract:
X-ray microscopy has become a commonly available and often used tool for element specific investigations on a nanometer scale. However, with a constantly growing user community the demand for a more flexible sample environment grows as well. In my talk I will describe several approaches that were realized at the SSRL and the ALS to push the limits of x-ray microscopy, e.g. how to improve the resolution of PEEM microscopy without any changes to the microscope, how to measure in large magnetic fields with sub 10ps time resolution or how to follow chemical reactions in situ.