Upcoming Events

Superconducting Transition-Edge Sensors for X-ray Science

November 16, 2012 10:00AM to 12:00PM
Presenter 
Joel Ullom, NIST Boulder
Location 
Building 402, Room E1100
Type 
Seminar
Series 
XSD Special Presentation
The seminar takes place at 10 a.m. followed by a discussion at 11 a.m.

Abstract:
The maturity of superconducting transition-edge sensors (TESs) has increased dramatically in recent years. These devices can now provide x-ray resolving powers, E/AE, of 3x103 or higher. While the small size and low count rates of individual TESs have traditionally limited their applicability, arrays of TESs can overcome these constraints.

Arrays of up to 104 elements are now in use for bolometric applications, arrays of up to 256 elements are in use for x-ray spectroscopy, and the recent introduction of microwave readout techniques has provided a technological path to arrays of 105-106 elements. Here, we review the status of TES technology, emphasizing developments at NIST. We describe potential applications in x-ray science including emission spectroscopy, Compton scattering, and time-resolved absorption spectroscopy. Finally, we show early results from a TES spectrometer recently deployed at the National Synchrotron Light Source.