Publication
In situ X-Ray and Electron Scattering Studies of Oxide Molec
Authors
Yan, Xi; Wrobel, Friederike; Li, Yan; Zhou, Hua; Wang, Huan-hua; Bhattacharya, Anand; Sun, Jirong; Hong, Hawoong; Fong, Dillon
Abstract
We perform in situ synchrotron x-ray ray diffraction (SXRD)/reflection high energy electron diffraction (RHEED) studies on the growth of complex oxide thin films by molecular beam epitaxy. The unique deposition chamber, located at the Advanced Photon Source, allows the preparation of complex oxide samples with monolayer precision and facilitates the formation of direct correlations between in situ x-ray studies and the more prevalent RHEED investigations. Importantly, because SXRD and RHEED prob
Division
MSD
Publication Year
2020
Publication Type
Article