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Publication

In situ X-Ray and Electron Scattering Studies of Oxide Molec

Authors

Yan, Xi; Wrobel, Friederike; Li, Yan; Zhou, Hua; Wang, Huan-hua; Bhattacharya, Anand; Sun, Jirong; Hong, Hawoong; Fong, Dillon

Abstract

We perform in situ synchrotron x-ray ray diffraction (SXRD)/reflection high energy electron diffraction (RHEED) studies on the growth of complex oxide thin films by molecular beam epitaxy. The unique deposition chamber, located at the Advanced Photon Source, allows the preparation of complex oxide samples with monolayer precision and facilitates the formation of direct correlations between in situ x-ray studies and the more prevalent RHEED investigations. Importantly, because SXRD and RHEED prob

Division

MSD

Publication Year

2020

Publication Type

Article

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