A scanning tunneling microscope is used for the first time to detect x-ray magnetic circular dichroism (XMCD) and near edge x-ray absorption fine structure (NEXAFS) signals of buried magnetic interfaces, and shows the order of superlattice layers is critical for interfacial magnetism.
Significance and impact
The feasibility of these nascent characterization techniques to detect buried magnetic interfaces, potentially to the atomic scale, is demonstrated.
- La0.67Sr0.33MnO3 (LSMO) and LaNiO3 (LNO) samples were grown using ozone assisted molecular beam epitaxy (MBE) at the CNM.
- Characterization was performed using synchrotron x-ray scanning tunneling microscopy (SX-STM), at 110 K substrate temperature without an applied magnetic field, at Sector 4-ID-C of the APS.
Work was performed at the Center for Nanoscale Materials and the Advanced Photon Source.
About Argonne’s Center for Nanoscale Materials
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