Argonne National Laboratory

Haihua Liu

Assistant Scientist
  • Materials characterization by advanced analytical TEM methods, such as SAED, HREM, EELS, CBED, EFTEM, STEM, Lorentz microscopy, tomography, to investigate the relationship between materials properties and microstructure in physics and materials science
  • Ultrafast Electron Microscopy to study ultrafast dynamics in condensed matter physics, materials science, biology at a spatiotemporal resolution of atomic-scale and femtoseconds