GSAS-II User’s Meeting
This meeting will have short updates on work in progress or recently completed. Bob will discuss his progress with "the briar patch of magnetic symmetry" toward a universal treatment of magnetic scattering, and Brian will show recent additions for creating publication-quality "Rietveld" plots. Ample time will be left for open discussions.
GSAS-II is an APS-developed software package for X-ray and neutron diffraction supporting data analysis techniques that include single-crystal crystallography, powder diffraction crystallography (Rietveld analysis), stress and texture measurements, small-angle scattering, area detector calibration and integration, and soon reflectometry. It replaces the aging GSAS/EXPGUI packages, which are currently cited ~500 times/year, but GSAS-II offers many more capabilities.