Synchrotron X-ray characterization reveals the structural evolution of inorganic cluster growth and crystallization that results from SIS in polymeric templates.
Significance and Impact
A new characterization approach provides fundamental insights into the electrical conductivity of nanoscale electrodes. New insights may afford an efficient route to 3D arrays of precise-atom-number clusters.
- The grazing incidence geometry used for X-ray total scattering pair distribution function (GI-PDF) overcomes long-standing challenges of achieving high-resolution PDF for thin films.
- Even after annealing, In2O3 nanocrystal structures are shown to depend on synthesis conditions, offering new tunability.
- This synthesis method has important applications in water treatment, lithography, separations, and optical coatings.
Work was performed at Argonne National Laboratory.
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