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Nuclear Science and Engineering Division

Intermediate Voltage Electron Microscopy-Tandem

IVEM
The IVEM-Tandem Facility is used for in situ TEM studies of defect structures in materials under controlled ion irradiation and sample conditions.

The IVEM-Tandem facility is unique in its ability to image the changes in atomic structure and defect formation during irradiation at high magnification. The IVEM's important advantages include:

  • Real Time observation of defect formation and evolution during irradiation.
  • Well-controlled experimental conditions (constant specimen orientation and area, specimen temperature, ion type, ion energy, dose rate, dose, and applied strain).
  • Refine and validate computer model simulations of irradiation defect states.
  • High-dose ion damage is produced in hours, rather than the years such damage would require in a nuclear reactor, supporting studies of material response to high doses of particle (ion and neutron) irradiation.
  • In situ ion irradiation does not produce any radioactivity in samples.

 


Control desk at Argonne’s IVEM-Tandem facility.