Eastman, Jeffrey; Rittner, Mindy; , Donald; Weertman, J; Yoder, K Mechanical behavior of nanocrystalline aluminum-zirconium. Materials Science & Engineering. A, Structural Materials: Properties, Microstructure and Processing (1997)
Buchholz, Donald; Chang, Robert; Lei, J; Merkle, Karl; Mahajan, S; Markworth, P; Hinds, B; Marks, T; Huang, Y The growth of (001) YBa{sub 2}Cu{sub 3}O{sub 7-delta} thin films on (001) MgO by pulsed organo-metallic beam epitaxy with controlled in-plane orientation. Journal of Alloys and Compounds (1997)
Aronson, Meigan; Osborn, Raymond; Maple, M; de Sa, P; Tsvelik, A Non-Fermi-liquid scaling in UCu{sub 5-x}Pd{sub x}(x=1,1.5) : a phenomenological description. Europhysics Letters (1997)
Merkle, Karl; Huang, Y; Char, K Transmission electron microscopy microstructure characterization of YBCO/SrRuO{sub 3}/YBCO. Microscopy and Microanalysis (1997)
Sanders, Paul; Eastman, Jeffrey; Weertman, J Elastic and tensile behavior of nanocrystalline copper and palladium. Acta Metallurgica et Materialia (1997)
Muralidharan, Govindarajan; You, Hoydoo; Wu, X; Paulikas, Arvydas; Veal, Boyd An x-ray reflectivity study of oxidation of {Beta}-NiAl oxidation. Scripta Materialia (1997)
Renusch, Daniel; Grimsditch, Marcos; Veal, Boyd; Koshelev, I; Hou, Peggy Strain determination in thermally-grown alumina scales using fluoresence spectroscopy. Oxidation of Metals (1997)
Keblinski, Pawel; Phillpot, Simon; Wolf, Dieter; Gleiter, H Thermodynamically stable amorphous intergranular films in nanocrystalline silicon. Physical Review A (1997)
Eastman, Jeffrey; Li, S; Vetrone, James; Newnham, R; Cross, L Dielectric response in ferroelectric superlattices. Philosophical Magazine B (1997)
Auciello, Orlando; Gruverman, A; Tokumoto, H Scanning force microscopy of domain structure in ferroelectric thin films : imaging and control. Nanotechnology (1997)