Abstract: This talk will review technology challenges and solutions for pixel based imaging in the single particle regime. This is a common problem in high energy particle physics experiments where the subject is highly energetic charged particles, such as pions, electrons and muons. These imagers made using CMOS integrated circuits with either active bulk along the lines of commercial imagers, or hybrid integration with semiconductor sensors. An emerging direction is heterogeneous integration of materials to render CMOS circuits sensitive to such charged particles. The single particle detection approach can also be applied to photons, from x-rays to visible and IR. Treating photons as particles and considering the interaction with the detector as a single quantum system leads to novel approaches for (a) computing as part of the detection process and (b) optimal detection that can be realized with emerging methods of heterogeneous integration of nanomaterials on CMOS.
Microelectronics Colloquium