John W. Freeland has been a physicist at Argonne National Laboratory since 1998. His research is focused on the application of polarized X-ray techniques to probe the magnetism of surfaces and interfaces.

His current interests lie in understanding electronic and magnetic properties at the interface between dissimilar complex oxides. The broken symmetry at the interface and altered environment is an interesting area to explore what happens to the ground-state of competing strongly correlated electron systems.

As lead scientist of a polarized soft X-ray effort at the Advanced Photon Source, he is also exposed to a wide variety of problems in the arena of magnetism in addition to his ongoing research program.

Education

• Physics, Ph.D, The Johns Hopkins University, 1996
• Physics, B.S., Beloit College, Beloit, Wisconsin, 1990
• National Research Council Postdoctoral Fellowship, 1996-1998

Awards, Honors, & Memberships

• National Research Council Fellow (1996-1998)
• American Physical Society member