Advanced Electron Microscopy for Structure-Property Relationships in Complex Materials and Electronic Devices

Abstract: Analytical (scanning) transmission electron microscopy (TEM/STEM), particularly 4D-STEM, provides a powerful way to probe structural phases and local heterogeneity. This is especially important for materials in which defects and nanoscale heterostructures govern behavior, including phase transitions and mechanical or electrical response. With recent advances in in-situ holders and high-speed detectors, these approaches are becoming increasingly powerful for studying materials under varied experimental conditions.

In this presentation, I will discuss how advanced electron imaging and diffraction, can be used to probe short-range order, planar faults, and dislocation activity in CrCoNi and related alloy systems. I will highlight the development of cepstral 4D-STEM for improved identification of planar faults and show how diffraction-based analysis, combined with conventional TEM and atomic-resolution STEM, can reveal local structure-defect relationships underlying deformation mechanisms. I will also briefly introduce ongoing efforts to extend these approaches to electrically driven experiments in HfO2-based ferroelectrics, as part of a broader direction toward dynamic studies of functional materials.