Tomas Polakovic is a Maria Goeppert Mayer Fellow at Argonne’s Physics Division. He earned his M.S. in solid state physics at the Comenius University in Bratislava, Slovakia in 2016, where he was working on numerical and experimental micro magnetism at the Institute of Electrical Engineering of the Slovak Academy of Sciences. He earned his Ph.D. in physics at Drexel University in Philadelphia, Pennsylvania and was focusing on strongly correlated electronic systems in low-dimensional materials in collaboration with Argonne. Current research interests are in superconducting thin films and their applications in detectors, electronics and quantum information systems.