Eric Dufresne completed his PhD Thesis at McGill University in 1995 in the nascent field of X-ray Photon Correlation Spectroscopy (XPCS). After a Postdoctoral Fellowship at The University of Michigan where he participated in the construction of the 7-ID beamline, he moved to Argonne where he contributed to the completion of beamline 7-ID and 7-BM and supported user operation from 1999. In 2014, he returned to XPCS where he supports users science on 8-ID-E (Wide-angle XPCS) and 8-ID-I (SAXS XPCS). 

Research Interests

1. XPCS and Coherent x-ray diffraction
2. Time-resolved x-ray diffraction and imaging
3. X-ray optics and novel detectors
4. Laser-pump/x-ray probe experiments

Education

1. BSc Universite Laval, Quebec, Canada 1987
2. MSc University of Waterloo, Ontario, Canada 1990
3. PhD Mcgill University (Dean’s Honor List), Quebec, Canada 1995

Experience

1. NSERC Postdoctoral fellow, University of Michigan 1996-1998
2. Senior Research Associate in the Physical Science II, MHATT-CAT and the University of Michigan, 1998-2004 (Beamline scientist)
3. Beamline Scientist, Argonne National Lab, Sector 7 2004-2011
4. Physicist, Argonne National Lab, Sector 7, 2011-

Awards and Honors

1. Several NSERC undergraduate and graduate fellowship
2. Quebec FCAR graduate fellowship

Selected Publications

1. Intermittent Defect Fluctuations in Oxide Heterostructures, Qingteng Zhang, Gang Wan, Vitalii Starchenko, Guoxiang Hu, Eric M. Dufresne, Hua Zhou, Hyoungjeen Jeen, Irene Calvo Almazan, Yongqi Dong, Huajun Liu, Alec R. Sandy, George E. Sterbinsky, Ho Nyung Lee, P. Ganesh, and Dillon D. Fong, Advanced Materials 35, 2305383 (2023).
2. Focusing a round coherent beam by spatial filtering the horizontal source, Eric M. Dufresne, Suresh Narayanan, Ruben Reininger, Alec R. Sandy and Larry Lurio, J. Synchrotron Rad. 27 1528–1538 (2020).
3. Stress breaks universal aging behavior in a metallic glass, Amlan Das, Peter M. Derlet, Chaoyang
   Liu, Eric M. Dufresne, and Robert Maass, Nature Communications 10 Art. num. 5006 (2019).
4. Ultrafast Three-Dimensional Integrated Imaging of Strain in Core/Shell Semiconductor/Metal Nanostructures, M. J. Cherukara, K. Sasikumar, A. DiChiara, S.J. Leake, W. Cha, E.M. Dufresne, T. Peterka, I. McNulty, D.A. Walko, H. Wen, S.K.R.S. Sankaranarayanan, and R.J. Harder, Nano Letters 17, 7696-7701 (2017). 
5. Dynamic Scaling of Colloidal Gel Formation at Intermediate Concentrations, Q. Zhang, D. Bahadur, E.M. Dufresne, P. Grybos, P. Kmon, R.L. Leheny, P. Maj, S. Narayanan, R. Szcyygiel, S. Ramakrishnan, and A. Sandy, Phys. Rev. Lett., 119 178006 (2017). 
6. Pushing X-ray Photon Correlation Spectroscopy beyond the continuous frame limit, E.M. Dufresne, S. Narayanan, A.R. Sandy, D.M. Kline, Q. Zhang, E.C. Landahl, and S. Ross, Opt. Express 24 355-364 (2016).