- X-ray Bragg Ptychography for studying structural defects in quantum materials
- Full Field X-ray Diffraction Microscopy under in situ and operando conditions, e.g., annealing (1000K), cryogenic cooling (50K), electrochemistry cycling, time resolved (150 ps), etc.
- Grazing Incidence X-ray Diffraction and Small Angle X-ray Scattering for studying group IV semiconductor nanowires in situ during growth and deformation.
Ph.D., University of Grenoble Alpes, France
M.Sc.Eng., Ecoles des Mines de Saint Etienne, France
B.Eng., Shanghai Jiao Tong University